Main Content

Structural Characterisation

Optical Microscopy

Click here to read more about optical microscopy.
Atomic Force Microscopy (AFM)

Read more about how we use AFM to image surface topographies.
Scanning Tunneling Microscopy (STM)

Read more about how STM works and what we use it for.
Low-Energy Electron Diffraction (LEED)

Read more about LEED and what we use it for.
X-ray Diffraction (XRD)

Click here to read more about how we use XRD to figure out crystal structures.